Journal of Applied Sciences (Yingyong Kexue Xuebao)
Electronics and Information Engineering
ISSN 0255-8297, CODEN YKXUD4
Journal of Applied Sciences - Electronics and Information Engineering (JASEIE) is a bimonthly started publication in 1983. It is sponsored jointly by Shanghai University and Institute of Technical Physics of Shanghai, Chinese Academy of Sciences, and published by Shanghai Science and Technology Press.
Editor-in-Chief:
HUANG Hung-chia, Academician of Chinese Academy of Sciences, Professor
Invited Editorial Board members:
TANG Ding-yuan, Academician of Chinese Academy of Sciences, Professor, Institute of Technical Physics of Shanghai, Chinese Academy of Sciences
ZOU Shi-chang, Academician of Chinese Academy of Sciences, Professor, Institute of Microsystems and Information Technology, Chinese Academy of Sciences
WEI Yu, Academician of Chinese Academy of Engineering, Professor, Ministry of Education
XIA Dao-xing, Academician of Chinese Academy of Sciences, Professor, Vanderbilt University, USA
Deputy Editors-in-Chief:
WANG Shuo-zhong, Professor, Shanghai University
WANG Jian-yü, Professor, Institute of Technical Physics of Shanghai, Chinese Academy of Sciences
Other editorial board members come from 19 universities and research institutes including Peking University, Tsinghua University, Zhejiang University, Shanghai Jiaotong University, Fudan University, etc. All members of the Editorial Board are listed in the Appendix.
The Journal receives submission from researchers all over the country as well as overseas. The Editorial Board is planning to strengthen itself by inviting international members, accepting submissions and inviting reviewers from abroad. Acceptance rate was around 50% before 2003, and dropped to less than 25% in 2005 and 2006. It is expected to drop further this year. Reduction of acceptance rate is an indication of improved overall quality of the Journal, which is largely due to the increased number of submissions and the tightened reviewing process.
The principal areas of coverage are information science and technology including communication and information engineering, signal and information processing, computer science, electronics, automation, etc. The Journal also covers some other arrears of applied sciences such as mechatronical engineering, material science, applied physics and applied mathematics.
Percentages of the published papers in information science and electronics were around 50% to 60% in the past three years, and that of mechatronical engineering and automation took about 20% of the total.
Papers in various fields of applied sciences, especially electronics, information technology and computer science are indexed in Science Abstracts (SA, INSPEC, UK), Cambridge Scientific Abstracts (CSA, USA), Abstract Journal of VINITI (РЖ, Russia), IEEE Microwave and Wireless Components Letters, etc. Papers of other areas such as material science, applied mathematics and applied physics are indexed in Chemical Abstract (CA), CSA, РЖ, etc.
Engineering aspects and applications of the research achievements are emphasized. Results of theoretical studies must be supported by experimental data. Works of pure science such as mathematics and theoretical physics, and managerial science are considered unsuitable to be published in the Journal.
In handling all submitted manuscripts, the Journal follows a rigorous peer review procedure and editorial practices conforming to international standards:
1. Preliminary review: This is carried out in the editorial office to check if the submitted material falls within the scope of publication. If not, the material is returned to the author(s) immediately. When the submitted material is clearly not up to the standard of the Journal, it is rejected right away.
2. Peer review: The manuscript is sent to two experts who are chosen from an established and continually updating database. Referees are asked to score the manuscript according to the technical suitability, technical depth and soundness, novelty, bibliography, and quality of presentation, and to provide their comments. If necessary, the manuscript is sent to an additional referee.
3. Revision: Comments are forwarded to the author(s) for modification without revealing identity of the reviewers. A revised version of the manuscript is then sent to the original referee for re-review if so required.
4. Evaluation: The originally submitted and revised manuscripts, a letter from the author(s) containing reply to the comments and explanation on the modifications made, and the review comments are evaluated by a member of the Editorial Board. A recommendation as to whether the manuscript should be accepted or rejected is made.
5. Decision: A decision is made on the basis of the referees’ comments and editorial board member’s recommendation.
With continually improving academic and editorial quality, Journal of Applied Sciences -Electronics and Information Engineering has been making important contributions to the dissemination and exchange of research findings in engineering disciplines. The number of published works supported by various science foundations, especially the Natural Science Foundation of China, is steadily increasing. It reaches about 70% in the recent three years.
The Journal has won a number of awards:
Award for Contest of Outstanding Science and Technology Periodicals in Shanghai, 1996
Award of Excellency in Carrying through the National Norm of CAJ-CD in 2000
Listed in the Array of China Periodicals in 2001
Second Award of Excellent University Sponsored Journals in 2004
Certificate of Outstanding Scientific Journal of Chinese University issued by the Ministry of Education, 2006
Contact:
Professor WANG Shuozhong, Ph.D., Deputy Editor-in-Chief
Address: 149 Yanchang Road, Shanghai 200072, People’s Republic of China
Phone: 86-21-66136275
Email: shuowang@shu.edu.cn
URL: http://www.ci.shu.edu.cn/wsz.htm
Appendix: Editorial Board of Journal of Applied Sciences
Editor-in-Chief:
Huang Hung-chia Academician of Chinese Academy of Sciences, Professor, Shanghai University
Invited Members of the Editorial Board:
Tang Dingyuan Academician of Chinese Academy of Sciences, Professor, Institute of Technical Physics of Shanghai, Chinese Academy of Sciences
Zou Shichang Academician of Chinese Academy of Sciences, Professor, Institute of Microsystems and Information Technology, Chinese Academy of Sciences
Wei Yu Academician of Chinese Academy of Engineering, Professor, Ministry of Education
Xia Daoxing Academician of Chinese Academy of Sciences, Professor, Vanderbilt University, USA
Chin-Chen Chang Chair Professor, Feng Chia University, Taiwan
Yan Yixun Professor, Chinese Academy of Sciences
Fang Minglun Professor, Shanghai University
Xü Deming Professor, Shanghai University
Gong Zhenbang Professor, Shanghai University
Wang Shenghong Professor, Fudan University
Guo Benyü Professor, Shanghai Normal University
Chen Yixin Professor, Shanghai Jiaotong University
Wang Naili Professor Emeritus, former Institute of Metallurgy, Chinese Academy of Sciences
Deputy Editors-in-Chief:
Wang Shuozhong Professor, Shanghai University
Wang Jianyü Professor, Institute of Technical Physics of Shanghai, Chinese Academy of Sciences
Members:
Huang Jiwu Professor, Sun Yat-sen University
Jiang Changjun Professor, Tongji University
Jiao Licheng Professor, Xidian University
Li Yühe Professor, Tsinghua University
Li Zhenhua Professor, Nanjing University of Science and Technology
Lu Wei Professor, Institute of Technical Physics of Shanghai, Chinese Academy of Sciences
Mao Junfa Professor, Shanghai Jiaotong University
Miao Huaikou Professor, Shanghai University
Ping Xijian Professor, Zhengzhou University of Information Engineering
Sun Shengli Professor, Institute of Technical Physics of Shanghai, Chinese Academy of Sciences
Tu Dawei Professor, Shanghai University
Wang Runtian Professor, Shanghai Acoustics Laboratory, Chinese Academy of Sciences
Wang Xiangchao Professor, Institute of Optical Instrumentation of Shanghai, Chinese Academy of Sciences
Wang Yuanyuan Professor, Fudan University
Xiao Jianzhong Professor, Huazhong University of Science and Technology
Yang Yixian Professor, Beijing Post and Telecommunications University
Yan Zhuangzhi Professor, Shanghai University
You Xiaohu Professor, Southeast University
Zha Hongbin Professor, Peking University
Zhang Qiqing Professor, Chinese Academy of Medical Science
Zhao Jianlong Professor, Institute of Microsystems & Information Technology, Chinese Academy of Sciences
Zhou Xiaojun Professor, Zhejiang University
