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反射调制通用超高频射频识别系统测试平台

王平1，胡爱群2，赵洪新2   

  1. 1.东南大学 信息安全研究中心，江苏 南京 210018;

    2 .南京航空航天大学 自动化学院, 江苏 南京 210016

  • 收稿日期:2006-08-11 修回日期:2007-06-25 出版日期:2007-09-30 发布日期:2007-09-30

A Back-Scatter Based Universal Testing System for UHF RFID

WANG Ping1.2, HU Ai-qun1, ZHAO Hong-xin1   

  1. 1. Institute of Information Security, Southeast University, Nanjing 210018, China
    2.College of Automation,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China
  • Received:2006-08-11 Revised:2007-06-25 Online:2007-09-30 Published:2007-09-30

被引次数

3

摘要： 该文对超高频射频识别系统的反射调制机制进行研究，提出一种基于反射调制技术识别的测试平台方案。该平台可对调制、编码和防碰撞机制进行编程修改的通用性测试。文中分别对标签端和处理部分的供电、信号检波、反射负载、进行了设计和阻抗匹配计算，设计并实现了读卡器端和基带处理部分的射频端。理论分析和实验验证表明，该测试平台适合于不同协议的射频识别和低速无线通讯系统的试验。

关键词: 反射调制, 阻抗匹配, 编解码, 调制, 防碰撞, 超高频

Abstract: A universal standard testing platform is designed based on research of the back-scattering mechanism of UHF RFID systems. Techniques needed for modulation, encoding and anti-collision are studied and implemented on the platform. Power supply, signal detector, reflector and controller of the Tag is designed and discussed, and impedance of the circuits calculated and matched. Design of the reader of this platform is also presented. The system can be used as a platform for various protocols of RFID and narrow bandwidth communications.

Key words: back-scattering, impedance match, UHF, encoding, modulation, anti-collision