English
基于阈值电压的IGBT芯片疲劳失效模型
李游, 曹继伟, 郝光耀, 闫戈, 刘虹晓
Fatigue Failure Model of IGBT Chip Based on Threshold Voltage
LI You, CAO Jiwei, HAO Guangyao, YAN Ge, LIU Hongxiao
应用科学学报 . 2022, (5): 865 -875 .  DOI: 10.3969/j.issn.0255-8297.2022.05.015