English
扫描光荧光表征半导体材料特性
宗祥福, 翁渝民, 刘松, 秦曦
A SYSTEM FOR CHARACTERIZATION OF SEMICONDUCTOR MATERIALS USING SCANNING PHOTOLUMINESCENCE
ZONG XIANGFU, WENG YUMIN, LIU SONG, QIN XI
应用科学学报 . 1992, (1): 78 -84 .