Journal of Applied Sciences ›› 2012, Vol. 30 ›› Issue (6): 655-660.doi: 10.3969/j.issn.0255-8297.2012.06.016

• Electronic Engineering • Previous Articles     Next Articles

RET Antenna Scan Code Formation and Collision Resisting Algorithm

DENG Chun-jian1, WANG Xu-zhi2, LUO Ren-ze3, DENG Sheng-hua1   

  1. 1. Zhongshan Institute, University of Electronic Science and Technology of China, Zhongshan 528402,
    Guangdong Province, China
    2. School of Communication and Information Engineering, Shanghai University, Shanghai 200072, China
    3. Institute of Electrical and Information Engineering, Southwest Petroleum University,
    Chengdu 610500, China
  • Received:2011-07-25 Revised:2012-02-17 Online:2012-11-27 Published:2012-02-17

Abstract: Optimization of structure and scanning steps of scan codes is a key to improving recognition efficiency of scanning anti-collision algorithm for antenna line devices (ALD). By studying the influence of combining the mask and matching code on the scanning time, the mask extension by bit can be achieved to
approach the device UID so that the scanning time is reduced. Meanwhile, from layered analysis, optimal bit number is obtained in the mask extension. The two-bit mask extension has been shown to be optimal. Accordingly, scan codes are constructed, and a scanning anti-collision algorithm for ALD based on the two-bit mask extension is proposed. The simulation analysis shows the good scanning performance of the proposed algorithm.

Key words: antenna interface standards group (AISG) protocol, remote electrical tilt, device scanning, algorithm performance

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