退火对杂化膜驻极体PVDF/SiO2电荷贮存的影响

Journal of Applied Sciences ›› 1996, Vol. 14 ›› Issue (4): 379-384.

• Articles • Next Articles

THE INFLUENCE OF ANNEALING PROCESS ON THE CHARGE STORAGE IN HyBRID FILM ELECTRET PVDF/SiO₂

BAI WEI, YANG DABEN

University of Electronic Sicence and Technology of of China

Received:1994-10-14 Revised:1995-12-10 Online:1996-12-31 Published:1996-12-31

Abstract

Abstract: In this paper,the influence of annealing process on the charge storage and stability in hybrid film electret PVDF/SiO₂ was studied by means of surface potential decay and TSD-spectra. The properties of the film, before and after annealing, were discussed by means of infrared spectrum analysis. The experimental results show that electret properties of the sample were improved after annealing.

Key words: charge storage, annealing, charge stability, electret surface potential

BAI WEI, YANG DABEN. THE INFLUENCE OF ANNEALING PROCESS ON THE CHARGE STORAGE IN HyBRID FILM ELECTRET PVDF/SiO₂[J]. Journal of Applied Sciences, 1996, 14(4): 379-384.

[1]	YANG Jin-sheng, LIN Zhen-jun. Modified Support Vector Machine for Wireless Localization [J]. Journal of Applied Sciences, 2017, 35(6): 685-692.
[2]	ZHANG Kang, GAO Hong-hao, ZHU Yong-hua, XU Hua-hu. QoS Dynamic Web Services Composition Method Based on Improved Simulated Annealing Algorithm [J]. Journal of Applied Sciences, 2017, 35(5): 570-584.
[3]	WANG Jian-qing, LI Fan, ZHAO Jian-hui. Route Planning in Low Altitude Penetration for Cruise Missile Based on a Hybrid Particle Swarm Optimization [J]. Journal of Applied Sciences, 2012, 30(3): 317-323.
[4]	JIN Yi, WANG Ji-wu, WU Le-nan. EBPSK Signal Detector Based on IM-SAPSO and SVM [J]. Journal of Applied Sciences, 2012, 30(2): 141-145.
[5]	CAO Guo-gang;RONG Cheng-cheng;LUO Li-min. Medical Image Registration Based on Differential Evolution [J]. Journal of Applied Sciences, 2008, 26(3): 274-274 .
[6]	RONG Cheng-cheng;ZHOU Jian;CAO Guo-gang;LUO Li-min. Multi-resolution Elastic Registration Using Edge Contour Featrues [J]. Journal of Applied Sciences, 2007, 25(6): 608-608 .
[7]	CHEN Xin;LU Xun;ZHU Jin-fu. Simulated Annealing with Sorting for Gate Assignment in Hub Airport [J]. Journal of Applied Sciences, 2007, 25(5): 520-520 .
[8]	HOU Jing, SONG An-ping, WANG Zhuo, ZHANG Wu, LI Yuan-yuan, LI Yi-xue. Modularization of Metabolic Network Based on Graph Clustering Algorithm [J]. Journal of Applied Sciences, 2006, 24(6): 588-592.
[9]	QIAO Xi-xian, JIANG Xiao-hui, HUANG Qiang, HE Hong-mou, CHEN Li. Annual Runoff Prediction Based on GA and Simulated Annealing [J]. Journal of Applied Sciences, 2006, 24(4): 424-428.
[10]	PAN ZHONGLIANG, ZHANG GUANGZHAO, CHEN GUANGJU. A Circuit Test Generation Method Based on Optimization [J]. Journal of Applied Sciences, 1999, 17(2): 211-215.
[11]	ZHU XIANGYANG, ZHONG BINGLIN, YANG SHUZI. SSAR MODEL IDENTIFICATION BY SIMULATED ANNEALING [J]. Journal of Applied Sciences, 1997, 15(3): 259-264.
[12]	WU WEIJUN, LI BINGZONG, SHAO KAI, FANG HUA. THE EXPERIMENTAL STUDY ON GROWTH PROCESS OF CoSi₂/Si HETERO-EPITAXY By Co/Ti/Si MULTILAYER SOLID STATE REACTION [J]. Journal of Applied Sciences, 1996, 14(4): 403-408.
[13]	LIU PING, LI BINGZONG, HUANG WEINING, JIANG GUOBAO, GU ZHIGUANG. ION IMPLANTATlON THROUGH CoSi₂/Si AND SELF-ALIGNED SILICIDED MOS DEVICE TECHNOLOGY [J]. Journal of Applied Sciences, 1994, 12(4): 401-408.
[14]	LIN HUAMAO, XIA ZHONGFU, DING HAI, SHEN SHAOQUN. THE INFLUENCE OF CHEMICAL SURFACE MODIFICATION ON CHARGE STORAGE STABILITY IN THE THERMALLY CROWN SiO₂ FILM ELECTRET [J]. Journal of Applied Sciences, 1994, 12(2): 101-108.
[15]	CHEN CUNLI, SONG HAIZHI, HUA WENYU. THERMAL STABILITY OF SIMULTANEOUSLY FORMED TiN_xO_y/TiSi₂ FOR SHALLOW JUNCTION DEVICE APPLICATIONS [J]. Journal of Applied Sciences, 1993, 11(3): 253-257.

THE INFLUENCE OF ANNEALING PROCESS ON THE CHARGE STORAGE IN HyBRID FILM ELECTRET PVDF/SiO₂

PDF

Knowledge

Abstract

Cite this article

share this article

References

Related Articles 15

Recommended Articles

Metrics

Comments

THE INFLUENCE OF ANNEALING PROCESS ON THE CHARGE STORAGE IN HyBRID FILM ELECTRET PVDF/SiO2

PDF

Knowledge

Abstract

Cite this article

share this article

References

Related Articles 15

Recommended Articles

Metrics

Comments

THE INFLUENCE OF ANNEALING PROCESS ON THE CHARGE STORAGE IN HyBRID FILM ELECTRET PVDF/SiO₂