Journal of Applied Sciences ›› 1991, Vol. 9 ›› Issue (2): 185-188.
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CHONG FUMIN, CHEN JINGYI
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Abstract: A conventional X-ray diffractometer is used to analyse the structure of InxGa1-x As/GaAs superlattice. Kinematical approximation is employed in the analysis. The results are similar to those got by double-crystal diffractometry The differences between the two methods are also discussed.
Key words: X-ray diffraction, superlattice, structure parameters
CHONG FUMIN, CHEN JINGYI. X-RAY DIFFRACTOMETRY OF THE STRUCTURE OF InxGa1-xAs/GaAs SUPERLATTICE[J]. Journal of Applied Sciences, 1991, 9(2): 185-188.
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