Abstract: A partial scan algorithm for BIST, which combines the structure analysis and testability analysis, is presented in this paper.The basic principle and implementation of the algorithm are analyzed in detail.The fault simulation experiments on ISCAS89 benchmark circuits by means of this algorithm are made, and the results are compared with the full scan algorithm and the partial scan algorithm based only on the structure analysis.Compared with the full scan algorithm and the partial scan algorithm based only on the structure analysis, our partial scan algorithm can greatly reduce the test time with very close or even greater faults coverage and mess area than the full scan algorithm.

Key words: BIST, partial scan, test time, COP