Journal of Applied Sciences ›› 2001, Vol. 19 ›› Issue (3): 228-232.

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Fault Detection for Linear Analog IC: The Method of Short Circuit Admittance Parameters

LI Feng, SHANG Hui-liang, KONG Qing-sheng   

  1. Department of Electronic Engineering, Fudan University, Shanghai 200433, China
  • Received:2000-06-16 Revised:2000-10-08 Online:2001-09-30 Published:2001-09-30

Abstract: A fault detection method, i.e, the method of short-circuit admittance parameters, for linear analog IC is proposed in this paper. Only two time voltage measurements at the ports of the circuit are suggested to decide whether the circuit is working normally. This method can be used to design a circuit automatic detecting equipment for technicians to decide whether there is any fault in the linear analog circuits. The attractive merits of this method are the component parameter tolerance and the error reduction in measurement and calculation.

Key words: analog integrated circuits, fault detection, short-circuit admittance parameters

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