Journal of Applied Sciences ›› 1994, Vol. 12 ›› Issue (1): 88-91.

• Articles • Previous Articles     Next Articles

STUDY OF OPTIMAL PROCESSING FORXH-REP-2 POSITIVE ELECTRON-BEA MRESISTS

WANG GUOQUAN, LOU TENGJIAO, WANG QINMEI, WU YULI   

  1. Shanghai Institute of Metallurgy, Academia Sinica
  • Received:1991-11-18 Revised:1992-10-07 Online:1994-03-31 Published:1994-03-31

Abstract: This paper describes briefly the principle and characteristics of electron-beam lithography.The mechanism of the interaction of energetic electrons with resist materials is also described.The whole processing of XH-REP-2 positive electronbcam resists discussed in detail. We have found a group of optimal parameters of XH-REP-2 positive electron-beam resists and come to the conclusion that XH-REP-2 positive electron-beam resists have high resolution and sensitivity.

Key words: descum, electron-beam lithography