Abstract: Based on conformal mapping,the following relations are deduced in this paper.1.The relation between the number of colner squares of the thin film resis-tances and the ratio of width beside the corners;2.The relation between the equi-valent number of squares of tape resistances whose width can change suddenly and the ratio of the width at its two sides.The calculations agree with the experimental results satisfactorily.

Key words: thinfilm resistance, integrated circuits, numericalcalculation