Journal of Applied Sciences ›› 2000, Vol. 18 ›› Issue (3): 255-258.

• Articles • Previous Articles     Next Articles

Influence of Boron Ion Implantation on the Electret Properties and Mechanic Properties of Si3N4 Film Based on Silicon Substrate

ZHANG Xiao-qing1, XIA Zhong-fu1, PAN Yong-gang1, ZHANG Ye-wen1, LI Bao-qing2, LIN Zi-xin2   

  1. 1. Pohl Institute, Tongji University, Shanghai 200092, China;
    2. Shanghai Institute of Metallurgy, Academia Sinica, Shanghai 200050, China
  • Received:1999-08-09 Revised:1999-12-12 Online:2000-09-30 Published:2000-09-30

Abstract: Amorphous silicon nitride (Si3N4) film has outstanding electret properties and it is compatible with the micromachining technology, so it can be used in miniature microphone. But big tensile stress of Si3N4 film limits its application. In this paper, the improvement of mechanical property of Si3N4 film by boron ion implantation and its influence on the electret properties of the film is discussed. The results show that the boron ion plantation reduces the tensile stress of film effectively,but it also decreases the electret properties of the film. The capability of Si3N4 electret film against environmental conditions can be increased by chemistrical surface modification. Therefore, Si3N4 film may be used as a vibrating film. After the stability of charge storage is improved,it may be used as electret material for miniature microphones.

Key words: silicon nitride film, electret, boron ion implantation, internal stress

CLC Number: