Journal of Applied Sciences ›› 1983, Vol. 1 ›› Issue (1): 63-70.
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CHEN BOLIANG, YU JINBI, DIN SUZHEN, WANG XINGFENG
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Abstract: In this paper some results from examining infrared detector materials using scanning electron microscope of type DX-3A (manufactured in China) are reported. Te-rich inclusions in HgCdTe and metal inclusions in PbSnTe have been detected successfully, the smallest dimension of which is ten micrometers. Precision determination of compositions of Hg1-xCdxTe and Pb1-xSnxTe crystals is made, and inho-mogeneity of △x/x>2% in a crystal wafer can be discriminated. The thieknees of hetero-epitaxial layer of PbSnTe-PbTe can also be determined.
CHEN BOLIANG, YU JINBI, DIN SUZHEN, WANG XINGFENG. APPLICATIONS OF SCANNING ELECTRON MICROSCOPE IN EXAMINATION OF INFRARED DETECTOR MATERIALS[J]. Journal of Applied Sciences, 1983, 1(1): 63-70.
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https://www.jas.shu.edu.cn/EN/Y1983/V1/I1/63
