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Journal of Applied Sciences ›› 2011, Vol. 29 ›› Issue (6): 631-636.doi: 10.3969/j.issn.0255-8297.2011.06.013

• Electronic Engineering • Previous Articles     Next Articles

Automatic Test for Chip Function Verification Using Adaptive Genetic Algorithm

SU Lin-lin, ZHANG Xiao-lin   

  1. School of Electronic and Information Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China
  • Received:2010-12-06 Revised:2011-02-27 Online:2011-11-30 Published:2011-11-27

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Abstract:

Abstract: This paper addresses two problems occurring in chip function verification: long verification time and high interdependency between verification and design under test. An automated test method using an adaptive genetic algorithm is presented for chip function verification. Event function coverage and event toggle coverage are defined, and the relationship between the two kinds of coverage is given. A fitness function is
generated to improve reliability using the function coverage and toggle coverage. Achieving the same coverage, the test time is reduced by about 25%-30% with the proposed method as compared to the simple genetic algorithm.

Key words: function verification, adaptive genetic algorithm (AGA), function coverage, toggle coverage, automated test

CLC Number: