High-speed optoelectronic devices are key elements for large-capacity optical fiber communication systems and wideband microwave photonic systems, in which the high-frequency characterization of optoelectronic devices is of importance for the precise signal conversion between optical domain and electrical domain. In this paper, we proposed a frequency-shifted heterodyne method based on optical heterodyne theory for mapping signal spectrum from optical domain to electrical domain, in order to obtain the joint analysis of optical spectrum and electrical spectrum in electrical domain. In experiments, we have successfully conducted self-calibrated high-frequency measurements with three devices including Mach-Zehnder modulators, phase modulators and photodetectors by carefully choosing the frequency relationship between the desired mapped electrical spectrum lines. The main characteristic of the devices, such as modulation index,half-wave voltages, chirp and responsivity are extracted. Experimental results indicate that our method is helpful for the wideband, high-resolution, multiparameter, self-calibration measurement of high-speed optoelectronic devices.
ZHANG Shangjian, WANG Mengke, ZHANG Yali, ZHANG Zhiyao, LIU Yong
. Self-Calibrated High-Frequency Analysis of High-Speed Optoelectronic Devices by Frequency-Shifted Heterodyne[J]. Journal of Applied Sciences, 2020
, 38(4)
: 630
-639
.
DOI: 10.3969/j.issn.0255-8297.2020.04.008
[1] Capmany J, Novak D. Microwave photonics combines two worlds[J]. Nature Photonics, 2007, 1(6):319-330.
[2] Yao J P. Microwave photonics[J]. Journal of Lightwave Technology, 2009, 27(3):314-335.
[3] Xie L, Man J W, Wang B J, et al. 24 GHz directly modulated DFB laser modules for analog applications[J]. IEEE Photonics Technology Letters, 2012, 24(5):407-409.
[4] Shi Y Q, Yan L S, Willner A E. High-speed electrooptic modulator characterization using optical spectrum analysis[J]. Journal of Lightwave Technology, 2003, 21(10):2358-2367.
[5] Courjal N, Dudley J M, Porte H. Extinction-ratio-independent method for chirp measurements of Mach-Zehnder modulators[J]. Optics Express, 2004, 12(3):442-448.
[6] Oikawa S, Kawanishi T, Izutsu M. Measurement of chirp parameters and halfwave voltages of Mach-Zehnder-type optical modulators by using a small signal operation[J]. IEEE Photonics Technology Letters, 2003, 15(5):682-684.
[7] Kim H, Gnauck A H. Chirp characteristics of dula-drive Mach-Zehnder modulator with a finite DC extinction ratio[J]. IEEE Photonics Technology Letters, 2002, 14(3):298-300.
[8] Bowers J E, Burrus C A. Optoelectronic components and systems with bandwidths in excess of 26 GHz[J]. RCA Review, 1985, 46(4):496-509.
[9] Hale P D, Williams D F. Calibrated measurement of optoelectronic frequency response[J]. IEEE Transactions on Microwave Theory and Techniques, 2003, 51(4):1422-1429.
[10] Wu X M, Man J W, Xie L, et al. Novel method for frequency response measurement of optoelectronic devices[J]. IEEE Photonics Technology Letters, 2012, 24(7):575-577.
[11] Chtcherbakov A A, Kisch R J, Bull J D, et al. Optical heterodyne method for amplitude and phase response measurements for ultrawideband electrooptic modulators[J]. IEEE Photonics Technology Letters, 2007, 19(1):18-20.
[12] Bowers J E, Burrus C A. Ultrawide-band long-wavelength p-i-n photodetectors[J]. IEEE/OSA Journal of Lightwave Technology, 1987, 5(10):1339-1350.
[13] Hawkins R T, Jones M D, Pepper S H, et al. Comparison of fast photodetector response measurements by optical heterodyne and pulse response techniques[J]. Journal of Lightwave Technology, 1991, 9(10):1289-1294.
[14] Eichen E G, Schlafer J, Rideout W, et al. Wide-bandwidth receiver photodetector frequency response measurements using amplified spontaneous emission from a semiconductor optical amplifier[J]. Journal of Lightwave Technology, 1990, 8(6):912-916.
[15] Baney D M, Sorin W V, Newton S A. High-frequency photodiode characterization using a filtered intensity noise technique[J]. IEEE Photonics Technology Letters, 1994, 6(10):1258-1260.
[16] Zhang B H, Zhu N H, Han W, et al. Development of swept frequency method for measuring frequency response of photodetectors based on harmonic analysis[J]. IEEE Photonics Technology Letters, 2009, 21(7):459-461.
[17] Yoshioka M, Sato S, Kikuchi T. A method for measuring the frequency response of photodetector modules using twice-modulated light[J]. Journal of Lightwave Technology, 2005, 23(6):2112-2117.
[18] Inagaki K, Kawanishi T, Izutsu M. Optoelectronic frequency response measurement of photodiode by using high-extinction ratio optical modulator[J]. IEICE Electronics Express, 2012, 9(4):220-226.
[19] Tan T S, Jungerman R L, Elliott S S. Optical receiver and modulator frequency response measurement with a Nd:YAG ring laser heterodyne technique[J]. IEEE Transactions on Microwave Theory and Techniques, 1989, 37(8):1217-1222.
[20] Hou S, Tucker R S, Koch T L. High-speed photodetector characterization by delay self-heterodyne method[J]. Electronics Letters, 1989, 25(24):1632-1634.
[21] Zhu N H, Wen J M, San H S, et al. Improved optical heterodyne methods for measuring frequency response of photodetectors[J]. IEEE Journal of Quantum Electronics, 2006, 42(3):241-248.
[22] Dennis T, Hale P D. High-accuracy photoreceiver frequency response measurements at 1.55μm by use of a heterodyne phase-locked loop[J]. Optics Express, 2011, 19(21):20103-20114.
[23] Zhang S J, Wang H, Zou X H, et al. Self-calibrating measurement of high-speed electro-optic phase modulators based on two-tone modulation[J]. Optics Letters, 2014, 39(12):3504-3507.
[24] Zhang S J, Wang H, Zou X H, et al. Optical frequency-detuned heterodyne for self-referenced measurement of photodetectors[J]. IEEE Photonics Technology Letters, 2015, 27(9):1014-1017.
[25] Zhang S J, Zhang C, Wang H, et al. Independently self-calibrated frequency response measurements of high-speed modulators and photodetectors with same setup[C]//Optical Fiber Communication Conference, Anaheim, 2016:1-3.
[26] Zhang S J, Zhang C, Wang H, et al. On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers[J]. Optics Express, 2017, 25(12):13340-13350.
[27] Zhang S J, Wang H, Zou X H, et al. Electrical probing test for characterizing wideband optical transceiving devices with self-reference and on-chip capability[J]. Journal of Lightwave Technology, 2018, 36(19):4326-4336.
