Computer Science and Applications

Test of Multiple Scan Chain Grafting Using Test Vector Merging

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  • 1. School of Computer and Information, Hefei University of Technology, Hefei 230009, China
    2. School of Physics and Electronic Science, Fuyang Normal College, Fuyang 236041, Anhui Province, China

Received date: 2010-04-07

  Revised date: 2010-07-05

  Online published: 2011-01-25

Abstract

 Although multiple scan chains can effectively decrease test time and reduce the test data, it requires more input channels so that the test cost is increased. To solve the problem, a grafting mechanism with multiple scan chains is proposed, which generates base vectors using a dislocation method in order to merge as many driving ends as possible based on correlation in the test vector. Experimental results show that the proposed
scheme uses fewer channels for the test data input and provides a higher compression ratio while maintaining high-speed testing for multiple scan chains.

Cite this article

LIU Jie1;2, LIANG Hua-guo1, YI Mao-xiang1 . Test of Multiple Scan Chain Grafting Using Test Vector Merging[J]. Journal of Applied Sciences, 2011 , 29(1) : 78 -82 . DOI: 10.3969/j.issn.0255-8297.2011.01.014

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