English

应用科学学报 ›› 1984, Vol. 2 ›› Issue (2): 162-169.

• 论文 • 上一篇    下一篇

微处理机的功能测试

闵应骅1, S. Y. H. Su2   

  1. 1. 铁道科学研究院;
    2. State University of New York
  • 收稿日期:1982-04-20 出版日期:1984-06-30 发布日期:1984-06-30

FUNCTIONAL TESTING FOR MICROPROCESSORS

MIN YINGHUA1, S. Y. H. SU2   

  1. 1. China academy of railway sciences, Beijing, China;
    2. State University of New York
  • Received:1982-04-20 Online:1984-06-30 Published:1984-06-30

PDF

77

被引次数

7

摘要： 微处理机的功能测试无论对微处理机的设计、生产和使用都是非常重要的.本文是Thatteand Abraham给出方法的扩展和补充.本文的测试方法能诊察某些文献[1]给出的方法不能诊察的故障,利用一个测试,检查几种类型的功能故障,而使测试简化.

Abstract: Three proceduces for testing register decoding, instruction decoding, data transfer, data storage and data manipulation function faults in microprocessors are described step-by-step in this paper. Each procedure is used for testing several types, instead of one type, of functional faults to simplify the testing. In addition, WRITE and READ decoding faults are tested separately, the proceduees presented in this paper thus have high fault coverage and efficiency.