数字系统功能级故障模型及测试产生方法

应用科学学报 ›› 1985, Vol. 3 ›› Issue (3): 241-248.

数字系统功能级故障模型及测试产生方法

闵应骅¹, Stephen Y. H. Su²

1. 铁道科学研究院;
2. State University of New York

收稿日期:1982-04-20 出版日期:1985-09-30 发布日期:1985-09-30

A FUNCTIONAL FAULT MODEL AND A TEST GENERATION PROCEDURE FOR DIGITAL SYSTEMS

MIN YINGHUA¹, Stephen Y. H. Su²

1. China Academy of Railway Sciences, Beijing, China;
2. State University of New York, Bingamton, New York, U. S. A

Received:1982-04-20 Online:1985-09-30 Published:1985-09-30

摘要/Abstract

摘要： 功能级故障测试由于特大规模集成电路技术的发展而变得越来越重要.和门级的固定为0(s-a-0)或固定为1(s-a-1)故障模型及D-算法相对应,本文对于用寄存器传输语言描述的数字系统,给出一个功能级的故障模型及测试产生的算法.

Abstract: This paper introduces a functional fault model for digital systems described by Register Transfer Language (RTL). A formal definition of standard statements in RTL is given, the functional faults are thug classified into eight types. A procedure for generating tests for any given functional fault is presented by using the inverse operation of the ETL description of the system under test. It is interesting to know that once the behavior of a digital system is described by RTL, similar ideas used in test generation for stuck-at faults can be pushed up to RTL level with each RTL statement as a "Component" of the system.

闵应骅, Stephen Y. H. Su. 数字系统功能级故障模型及测试产生方法[J]. 应用科学学报, 1985, 3(3): 241-248.

MIN YINGHUA, Stephen Y. H. Su. A FUNCTIONAL FAULT MODEL AND A TEST GENERATION PROCEDURE FOR DIGITAL SYSTEMS[J]. Journal of Applied Sciences, 1985, 3(3): 241-248.