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应用科学学报 ›› 1985, Vol. 3 ›› Issue (4): 313-317.

• 论文 • 上一篇    下一篇

时序线路的统计测试

窦如静   

  1. 华东计算技术研究所
  • 收稿日期:1982-06-29 修回日期:1984-05-03 出版日期:1985-12-31 发布日期:1985-12-31

STATISTICAL TESTING FOR SEQUENTIAL CIRCUITS

DOU RUJING   

  1. East-China Research Institute of Computer Technology
  • Received:1982-06-29 Revised:1984-05-03 Online:1985-12-31 Published:1985-12-31

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摘要： 本文提出的统计测试是时序线路压缩测试的一种新方案,它利用正常线路在随机输入下的统计特征即"接收区"检查待测线路是否存在故障.叙述了接收区概念的理论背景和计算方法.

Abstract: The statistical testing presented in this paper is an improved compact testing method for sequential circuits. The method tests circuits using ‘acceptance region’. The background for the theory on ‘acceptance region’ and practical computational method are given in this paper.