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应用科学学报 ›› 1985, Vol. 3 ›› Issue (4): 336-340.

• 论文 • 上一篇    下一篇

精密的低频相位校准标准

乐伟达, 胡新国, 陈桂芳   

  1. 上海测试技术研究所
  • 收稿日期:1982-12-20 修回日期:1984-06-20 出版日期:1985-12-31 发布日期:1985-12-31

PRECISION LOW FREQUENCY PHASE CALIBRATION STANDARD

LO WEIDA, HU XINGUO, CHENG GUEIFAN   

  1. Shanghai Institute Of Testing Technology
  • Received:1982-12-20 Revised:1984-06-20 Online:1985-12-31 Published:1985-12-31

PDF

75

被引次数

1

摘要： 一种新型高精密低频相位校准标准已研制成功,它采用相位误差倍减技术,在20Hz~100kHz (点频)内,相移量范围是0~n×360°(n是整数),准确度为±(1×10-6×F±0.001)度,F为工作频率,单位为Hz.相移量分辨率为(3×10-8×F)度.输出信号实测的失真度优于1×10-4,幅度稳定度优于1×10-5/10min.

Abstract: A new high-precision low frequency phase calibration standard has been developed by using a technique of phase error demultiplication. The frequency range is from 20 Hz to 100 kHz (discrete frequency). The phase shift is from 0 to (n×360) degrees, where n is an integer. Theresolution is (3×10-8×F) degrees, where F is in hertz. The accuracy is ±(1×10×F±0.001) degrees. The distortion is better than 1×10-5/10min.