应用科学学报 ›› 1987, Vol. 5 ›› Issue (3): 203-211.

• 论文 • 上一篇    下一篇

X射线单色聚焦照相零层衍射线的分辨率

郭常霖   

  1. 中国科学院上海硅酸盐研究所
  • 收稿日期:1984-12-15 修回日期:1985-05-18 出版日期:1987-09-30 发布日期:1987-09-30

RESOLVING POWER OF DIFFRACTION LINES ON THE EQUATOR OF MONOCHROMATIC X-RAY FOCUSSING PHOTOGRAPH

GUO CHANGLIN   

  1. Shanghai Institute of Ceramics, Academia Sinica
  • Received:1984-12-15 Revised:1985-05-18 Online:1987-09-30 Published:1987-09-30

摘要: 本文对影响X射线单色聚焦照相零层衍射线分辨率的各种因素作了详细的理论分析.给出了衍射线宽化与特征X射线谱线波长色散、双线波长差、单色器质量及调节状况、试样厚度及晶粒大小等之间的关系式及计算结果.用实验事实对影响分辨率的综合因素作了讨论.

Abstract: In this paper, the various factors affecting the reselving power of diffraction lines on the equator of monochromatic X-ray focussing photograph are analyzed in detail. The relationship equations and calculated results of the broadening of diffraction lines caused by wavelength dispersion of X-ray characteristic spectra, wavelength difference of -doublet, quality and inexact focussing of monoohro-mator, specimen thickness and grain size are given. According to the calculated and experiment results, the synthetic factor affecting the resolving power of diffraction line is discussed.