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应用科学学报 ›› 1993, Vol. 11 ›› Issue (4): 333-336.

• 论文 • 上一篇    下一篇

(CdTe-ZuTe)/ZnTe/GaAs(100)超晶格结构的X射线测定

钟福民1, 陈京一1, 朱南昌1, 李杰2, 袁诗鑫2   

  1. 1. 中国科学院上海冶金研究所;
    2. 中国科学院上海技术物理研究所
  • 收稿日期:1991-09-09 修回日期:1992-02-12 出版日期:1993-12-31 发布日期:1993-12-31
  • 基金资助:
    中国科学院上海冶金研究所青年基金资助课题

STRUCTURE DETERMINATION OF (CdTe-ZnTe)/ZnTe/GaAs(100) SUPERLATTICE BY X-RAY DIFFRACTION

ZHONG FUMING1, CHEN JINYI1, ZHU NANCHANG1, LI JIE2, YUAN SHIXIN2   

  1. 1. Shanghai Instituts of Metallurgy, Acadnmia Sinica;
    2. Shanghai Institute of Technical Physics, Academia Sinica
  • Received:1991-09-09 Revised:1992-02-12 Online:1993-12-31 Published:1993-12-31

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摘要： 用X射线衍射,并结合X射线动力学衍射理论模型的计算机模拟方法,对(CdTe-ZnTe)/ZnTe/GaAs(100)应变超晶格材料的结构进行了研究,得到了其结构参数和信息.

关键词: X射线衍射, 计算机模拟, 结构参数, 应变超晶格

Abstract: The X-ray diffraction (XRD) method was used in the investigation of the structure of (GdTe-ZnTe)/ZnTe/GaAs(100) strained-layer superlattice. The diffraction profile was analysed by means of the X-ray diffraction theory and computer simulation to obtain the structure parameters and information.

Key words: structure parameter, X-ray diffraction, strained-layer superlattice, computer simulation