应用科学学报 ›› 1998, Vol. 16 ›› Issue (3): 355-359.

• 论文 • 上一篇    下一篇

氧化铝陶瓷/金刚石膜复合材料的表征及介电性质研究

莫要武, 夏义本, 辛吉升, 黄晓琴, 王鸿   

  1. 上海大学
  • 收稿日期:1996-09-19 修回日期:1997-01-09 出版日期:1998-09-30 发布日期:1998-09-30
  • 作者简介:莫要武:博士,讲师,上海大学材料科学与工程学院,上海 201800
  • 基金资助:
    国家自然科学基金

Investigation of the Dielectric Properties and Characterization of Diamond Film/Alumina Composites

MO YAOWU, XIA YIBEN, XIN JISHENG, HUANG XIAOQIN, WANG HONG   

  1. School of Materials Science & Engineering, Shanghai University, Shanghai 201800
  • Received:1996-09-19 Revised:1997-01-09 Online:1998-09-30 Published:1998-09-30

摘要: 采用MPCVD和HFCVD在氧化铝陶瓷基片上沉积金刚石薄膜.用扫描电镜(SEM)、X射线衍射(XRD)和Raman散射分析表征了沉积膜的质量,并测定和分析了氧化铝/金刚石膜复合材料的介电性质.

关键词: 薄膜, 氧化铝, 介电性质, 金刚石

Abstract: Diamond films were deposited on Al2O3 substrates by microwave plasma chemical vapor deposition (MPCVD) and hot filament chemical vapor deposition (HFCVD) techniques, respectively. The qualities of the deposited films were characterized by scanning electron microscopy(SEM), X ray diffractive spectrometry and Raman scattering spectrometry. The dielectric properties of the diamond film/alumina composites were measured and analyzed as well.

Key words: diamond, thin film, alumina ceramics, dielectric properties