English

应用科学学报 ›› 2004, Vol. 22 ›› Issue (3): 356-359.

• 论文 • 上一篇    下一篇

全数字的模数转换器内建自测试方案

饶进, 吴光林, 凌明, 胡晨   

  1. 东南大学国家专用集成电路系统工程技术研究中心 江苏南京 210096
  • 收稿日期:2003-06-09 修回日期:2003-07-23 出版日期:2004-09-30 发布日期:2004-09-30
  • 作者简介:饶进(1980-),男,安徽安庆人,硕士生.

An All-Digital BIST Scheme for the ADC Test

RAO Jin, WU Guang-lin, LING Ming, HU Chen   

  1. National ASIC System Engineering Center, Southeast University, Nanjing 210096, China
  • Received:2003-06-09 Revised:2003-07-23 Online:2004-09-30 Published:2004-09-30

PDF

92

被引次数

5

摘要： 提出了一种针对片上模数转换器进行内建自测试的方法.利用斜坡信号作为测试激励,测试电路可以通过对转换器的低位进行测试来获取增益误差、失调误差以及微分非线性和积分非线性误差.该方法测试结构简单,并具有较高的测试速度.

关键词: 内建自测试, 测试算法, 模数转换器

Abstract: In this paper, a new built-in self-test approach has been applied to testing on-chip AD converters. A ramp signal is used as test stimulation. This test circuit is capable of measuring the offset, gain, integral nonlinearity(INL), and differential nonlinearity(DNL) errors by testing the low bits of ADC. Simple structure, and high speed are the advantages of the proposed test structure.

Key words: BIST, test algorithm, ADC

中图分类号: