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应用科学学报 ›› 2005, Vol. 23 ›› Issue (1): 61-66.

• 论文 • 上一篇    下一篇

一种基于结构和可测性分析的BIST部分扫描算法

谢永明, 李锐, 杨军   

  1. 东南大学国家专用集成电路系统工程技术研究中心, 江苏南京 210096
  • 收稿日期:2003-10-13 修回日期:2003-12-08 出版日期:2005-01-31 发布日期:2005-01-31
  • 作者简介:谢永明(1980-),男,江苏南京人,硕士生,E-mail:whynotxie@seu.edu.cn
  • 基金资助:
    国家自然科学基金资助项目(60176018)

A Partial Scan Algorithm for BIST Based on Structure Analysis and Testability Analysis

XIE Yong-ming, LI Rui, YANG Jun   

  1. National ASIC System Engineering Center, Southeast University, Nanjing 210096, China
  • Received:2003-10-13 Revised:2003-12-08 Online:2005-01-31 Published:2005-01-31

PDF

70

被引次数

3

摘要： 提出了一种在内建自测试(BIST)中进行部分扫描的算法,此算法综合了电路的结构分析和可测性分析.文中对其原理和实现分别进行了详细的叙述,最后运用此算法对ISCAS89 benchmark电路进行计算,修改其结构后进行故障模拟,并将实验结果与全扫描结构和仅考虑结构因素的部分扫描结构进行了比较,最后得出结论.

关键词: 可测性度评估算法, 测试时间, 内建自测试, 部分扫描

Abstract: A partial scan algorithm for BIST, which combines the structure analysis and testability analysis, is presented in this paper.The basic principle and implementation of the algorithm are analyzed in detail.The fault simulation experiments on ISCAS89 benchmark circuits by means of this algorithm are made, and the results are compared with the full scan algorithm and the partial scan algorithm based only on the structure analysis.Compared with the full scan algorithm and the partial scan algorithm based only on the structure analysis, our partial scan algorithm can greatly reduce the test time with very close or even greater faults coverage and mess area than the full scan algorithm.

Key words: BIST, partial scan, test time, COP

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