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应用科学学报 ›› 2005, Vol. 23 ›› Issue (2): 178-182.

• 论文 • 上一篇    下一篇

一种用于嵌入式内存测试的高效诊断算法

任爱玲, 凌明, 吴光林, 李锐   

  1. 东南大学国家专用集成电路系统工程技术研究中心, 江苏南京 210096
  • 收稿日期:2003-11-11 修回日期:2004-02-20 出版日期:2005-03-31 发布日期:2005-03-31
  • 作者简介:任爱玲(1978-),女,河南?阳人,硕士生,E-mail:ailing2008@eyou.con
  • 基金资助:
    国家自然科学基金资助项目(60176018)

An Efficient Diagnosis Algorithm for the Test of Embedded SRAM

REN Ai-ling, LING Ming, WU Guang-lin, LI Rui   

  1. National ASIC System Engineering Research Center, Southeast University, Nanjing 210096, China
  • Received:2003-11-11 Revised:2004-02-20 Online:2005-03-31 Published:2005-03-31

PDF

82

被引次数

25

摘要： 提出了一种具有自诊断功能的位定向MARCH-TB+算法,并在此算法的基础上,用共享型内建自测试电路结构完成了2k×1位嵌入式内存的测试和诊断.实验结果表明,提出的这种测试算法具有较高的故障覆盖率和较强的故障诊断能力,同时兼有测试长度短的优点.

关键词: 诊断算法, 嵌入式内存, 内建自测试

Abstract: This paper puts forward an self-diagnosis bit-oriented algorithm(MARCH-TB +), according to the testing algorithms,we use a shared built-in-self-test structure(parallel structure) to test and diagnose embedded SRAM(2k×1).The experimental results show that the proposed testing algorithm has high fault coverage, strong diagnostic ability and requires less testing time.

Key words: diagnosis algorithm, built-in-self-test, embedded RAM

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