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应用科学学报 ›› 2000, Vol. 18 ›› Issue (1): 55-57.

• 论文 • 上一篇    下一篇

Gd2O3-MgF2膜的正电子湮没研究

官月英, 史子康   

  1. 中国科学院福建物质结构研究所, 福建福州 350002
  • 收稿日期:1998-07-06 修回日期:1999-03-24 出版日期:2000-03-31 发布日期:2000-03-31
  • 作者简介:官月英(1949-),女,福建福州人,高级工程师.

A Study on the Gd2O3-MgF2 Film by Positron Annihilation Life Spectroscopy

GUAN Yue-ying, SHI Zi-kang   

  1. Fujian Institute of Research on Structure of Matter, Academia Sinica, Fuzhou 350002, China
  • Received:1998-07-06 Revised:1999-03-24 Online:2000-03-31 Published:2000-03-31

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摘要： 用22Na正电子湮没寿命谱学法检测石英片上Gd2O3-MgF2膜.阐明了正电子湮没参数和膜结构的关系.

关键词: 膜, 质量, 正电子湮没

Abstract: In this paper,the quality of Gd2O3-MgF2 film on thin quartz slice is determined by positron annihilation life spectroscopy. It illuminates the relationship between positron annihilation parameters and film structure.

Key words: positron annihilation, film, quality

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