English
用直线四探针头测量金属-半导体的接触电阻率
陈存礼, 华文玉
THE MEASUREMENT OF SPECIFIC CONTACTRESISTANCE OF M-S BY PROBE HEADSOF THE IN-LINE FOUR PROBES
CHEN CUNLI, HUA WENYU
应用科学学报 . 1989, (1): 61 -64 .