English
扫描电子显微镜在红外探测器材料分析中的应用
陈伯良, 俞锦陛, 丁素珍, 王行丰
APPLICATIONS OF SCANNING ELECTRON MICROSCOPE IN EXAMINATION OF INFRARED DETECTOR MATERIALS
CHEN BOLIANG, YU JINBI, DIN SUZHEN, WANG XINGFENG
应用科学学报 . 1983, (1): 63 -70 .