Journal of Applied Sciences ›› 1987, Vol. 5 ›› Issue (3): 203-211.

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RESOLVING POWER OF DIFFRACTION LINES ON THE EQUATOR OF MONOCHROMATIC X-RAY FOCUSSING PHOTOGRAPH

GUO CHANGLIN   

  1. Shanghai Institute of Ceramics, Academia Sinica
  • Received:1984-12-15 Revised:1985-05-18 Online:1987-09-30 Published:1987-09-30

Abstract: In this paper, the various factors affecting the reselving power of diffraction lines on the equator of monochromatic X-ray focussing photograph are analyzed in detail. The relationship equations and calculated results of the broadening of diffraction lines caused by wavelength dispersion of X-ray characteristic spectra, wavelength difference of -doublet, quality and inexact focussing of monoohro-mator, specimen thickness and grain size are given. According to the calculated and experiment results, the synthetic factor affecting the resolving power of diffraction line is discussed.