Abstract: In this paper a dual integral equation system in the measurement of semiconductors is suggested. The system is decoupled to be an equation of double integral by an integral transformation.
According to Schlömilch theorem, the 2-dimensional problem is reduced to be a one dimensional Fredholm equation. An exact formal solution is obtained and a criterion is suggested to prove the uniqueness of the formal solution. In addition, the relation between the current and transformation function and explicit expression of solution for small r₀ are also derived.