Abstract: In this paper, an equation of isothermal charge is derived for the direct determination of trap distribution in solid dielectrics according to the model of first-order trapping. Based on the configuration of distribution of space charges in solid dielectrics formed by the field emission, a method is suggested for distinguishing the electron from hole traps in the dielectric by using the surface potential technique. Therefore, the information of a single carrier trap is acquired. The parameters of traps in the dielectric PP is obtained by integrating theory with experiment. The theory and the testing method are of importance for studying the traps in solid dielectrics.

Key words: carriers, traps, dielectrics, charges, measurement