Journal of Applied Sciences ›› 1993, Vol. 11 ›› Issue (4): 333-336.

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STRUCTURE DETERMINATION OF (CdTe-ZnTe)/ZnTe/GaAs(100) SUPERLATTICE BY X-RAY DIFFRACTION

ZHONG FUMING1, CHEN JINYI1, ZHU NANCHANG1, LI JIE2, YUAN SHIXIN2   

  1. 1. Shanghai Instituts of Metallurgy, Acadnmia Sinica;
    2. Shanghai Institute of Technical Physics, Academia Sinica
  • Received:1991-09-09 Revised:1992-02-12 Online:1993-12-31 Published:1993-12-31

Abstract: The X-ray diffraction (XRD) method was used in the investigation of the structure of (GdTe-ZnTe)/ZnTe/GaAs(100) strained-layer superlattice. The diffraction profile was analysed by means of the X-ray diffraction theory and computer simulation to obtain the structure parameters and information.

Key words: structure parameter, X-ray diffraction, strained-layer superlattice, computer simulation