Abstract: Based on the unitized model of design centering for maximum manufacturing yield,optimal toleraneing design, optimal tuning design and design of minimized manufacturing costs of integration,an efficient method of solving DCTT is given under the conditions of sequential convexity of functions in this paper. The method combines the deterministic optimization technique with the orthogonal optimal experiment method to change the 2ⁿ vertices of the tolerance region into (n+1) constraint conditions,and uses nondifferentiable optimization to solve the DCTT problem directly. Therefore,the method can solve large scale IC statistical optimization problems.

Key words: integrated circuits, statistical programming, optimization techniques