Journal of Applied Sciences ›› 1995, Vol. 13 ›› Issue (1): 1-6.

• Articles •     Next Articles

OBSERVATIONO OF LB FILMS BY ATOMIC FORCE MICROSCOPY (AFM):FROM MICRON DOWN To MOLECULAR SCALES

YANG XIAOMIN, GU ZHONGZE, WEI YU   

  1. Southeast University
  • Received:1993-07-26 Online:1995-03-31 Published:1995-03-31

Abstract: The atomic force microscopy (AFM) was used to observe the microscopic structure of stearic acid LB films deposited on solid substrate,the range being from micron down to molecular scales.The AFM images show the surface morphology of the film intermolecular arrays as well as film defects.By increasing the applied force from the AFM tip, we can make a pattern on LB films and directly measure the thickness of the monolayer.

Key words: atomic force microscopy (AFM), LB film, stearic acid