Journal of Applied Sciences ›› 1999, Vol. 17 ›› Issue (2): 241-244.
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LIU XILING1, GUAN WENLI1, ZHANG JIE1, XU ZHONGBIN2
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Abstract: The defects in PrP5O14 crystals have been studied first by means of X-ray topography. It is found that the main defects are ferroelastic domains, antiphase domains, growth layers, growth sectors and dislocations. Their forming reasons are analysed and the way of improving the quality of crystals has been discussed.
Key words: PrP5O14 crystal, ferroelastic domain, antiphase domain, growth sector, growth layer
LIU XILING, GUAN WENLI, ZHANG JIE, XU ZHONGBIN. Topography of Defects in PrP5O14 Crystals by X Ray Diffraction[J]. Journal of Applied Sciences, 1999, 17(2): 241-244.
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https://www.jas.shu.edu.cn/EN/Y1999/V17/I2/241