全数字的模数转换器内建自测试方案

Journal of Applied Sciences ›› 2004, Vol. 22 ›› Issue (3): 356-359.

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An All-Digital BIST Scheme for the ADC Test

RAO Jin, WU Guang-lin, LING Ming, HU Chen

National ASIC System Engineering Center, Southeast University, Nanjing 210096, China

Received:2003-06-09 Revised:2003-07-23 Online:2004-09-30 Published:2004-09-30

Abstract

CLC Number:

TN45

RAO Jin, WU Guang-lin, LING Ming, HU Chen. An All-Digital BIST Scheme for the ADC Test[J]. Journal of Applied Sciences, 2004, 22(3): 356-359.

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An All-Digital BIST Scheme for the ADC Test

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