Journal of Applied Sciences ›› 2005, Vol. 23 ›› Issue (2): 178-182.
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REN Ai-ling, LING Ming, WU Guang-lin, LI Rui
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Abstract: This paper puts forward an self-diagnosis bit-oriented algorithm(MARCH-TB +), according to the testing algorithms,we use a shared built-in-self-test structure(parallel structure) to test and diagnose embedded SRAM(2k×1).The experimental results show that the proposed testing algorithm has high fault coverage, strong diagnostic ability and requires less testing time.
Key words: diagnosis algorithm, built-in-self-test, embedded RAM
CLC Number:
TN407
REN Ai-ling, LING Ming, WU Guang-lin, LI Rui. An Efficient Diagnosis Algorithm for the Test of Embedded SRAM[J]. Journal of Applied Sciences, 2005, 23(2): 178-182.
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https://www.jas.shu.edu.cn/EN/Y2005/V23/I2/178
