反射调制通用超高频射频识别系统测试平台

Journal of Applied Sciences ›› 2007, Vol. 25 ›› Issue (5): 456-456 .

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A Back-Scatter Based Universal Testing System for UHF RFID

WANG Ping1.2, HU Ai-qun1, ZHAO Hong-xin1

1. Institute of Information Security, Southeast University, Nanjing 210018, China
2.College of Automation,Nanjing University of Aeronautics and Astronautics,Nanjing 210016,China

Received:2006-08-11 Revised:2007-06-25 Online:2007-09-30 Published:2007-09-30

Abstract

Abstract: A universal standard testing platform is designed based on research of the back-scattering mechanism of UHF RFID systems. Techniques needed for modulation, encoding and anti-collision are studied and implemented on the platform. Power supply, signal detector, reflector and controller of the Tag is designed and discussed, and impedance of the circuits calculated and matched. Design of the reader of this platform is also presented. The system can be used as a platform for various protocols of RFID and narrow bandwidth communications.

Key words: back-scattering, impedance match, UHF, encoding, modulation, anti-collision

WANG Ping.;HU Ai-qun;ZHAO Hong-xin. A Back-Scatter Based Universal Testing System for UHF RFID[J]. Journal of Applied Sciences, 2007, 25(5): 456-456 .

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URL: https://www.jas.shu.edu.cn/EN/

https://www.jas.shu.edu.cn/EN/Y2007/V25/I5/456

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A Back-Scatter Based Universal Testing System for UHF RFID

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