Journal of Applied Sciences

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Multi-resolution Elastic Registration Using Edge Contour Featrues

RONG Cheng-cheng1, ZHOU Jian2, CAO Guo-gang1, LUO Li-min1   

  1. 1. Laboratory of Image Science and Technology, Southeast University, Nanjing 210096, China;
    2. U642 INSERM-Laboratoire Traitement du Signal et de l’Image (LTSI), Rennes 35000, France
  • Received:2007-04-03 Revised:2007-08-20 Online:2007-11-30 Published:2007-11-30

Abstract: A multi-resolution elastic registration method based on edge contour is presented. The C-V(Chan-Vese) model is applied to extract source and target contours from two human brain MR images. A multi-resolution simulated annealing procedure is proposed to match the two contour point sets with low computation cost. This way, a fast elastic registration method using B-spline interpolation function is obtained. Experimental results show that the proposed method provides fast image registration without loss of precision.

Key words: C-V model, B-spline, simulated annealing, multi-resolution, elastic registration