English

应用科学学报 ›› 1990, Vol. 8 ›› Issue (2): 185-188.

• 研究简报 • 上一篇    

赝Kossel衍射指数的模拟法确定

张建中, 范得培, 周兵   

  1. 南京大学
  • 收稿日期:1988-01-25 修回日期:1988-07-25 出版日期:1990-06-30 发布日期:1990-06-30

THE DETERMINATION OF PSEUDO-KOSSEL DIFFRACTION INDICES BY SIMULATION METHOD

ZHANG JIANZHONG, FAN DEPEI, ZHOU BING   

  1. Nanjing University
  • Received:1988-01-25 Revised:1988-07-25 Online:1990-06-30 Published:1990-06-30

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摘要： 晶体的X射线衍射非平行光法中,赝Kossel衍射是一个重要的方法[1].其中背射赝Kossel法最实用方便.

Abstract: The X-ray pseudo-Kossel diffraction indices of crystals can be determined on a large scale by using a simulation method, which is capable of indicating the indices of complete, incomplete or even severely broken.lines. By means of this method, the diffraction patterns could be made full use of and the standard diagrams of pseudo-Kossel diffraction can be offered.