English

应用科学学报 ›› 1999, Vol. 17 ›› Issue (4): 384-388.

• 论文 • 上一篇    下一篇

PTFE多孔膜驻极体电荷储存稳定性的机理研究

崔黎丽1, 江键1, 夏钟福2, 宋聚平2, 陈钢进2, 张冶文2   

  1. 1. 第二军医大学;
    2. 同济大学
  • 收稿日期:1998-07-06 修回日期:1998-09-23 出版日期:1999-12-31 发布日期:1999-12-31
  • 基金资助:
    国家自然科学基金资助项目(39770880)

A Study of Charge Storage Stability Mechanism for Porous Polytetrafluoroethylene (PTFE) Film Electret

CUI LILI1, JIANG JIAN1, XIA ZHONGFU2, SONG JUPING2, CHEN GANGJIN2, ZHANG YEWEN2   

  1. 1. Second Military Medical University, Shanghai 200433;
    2. Tongji University, Shanghai 200092
  • Received:1998-07-06 Revised:1998-09-23 Online:1999-12-31 Published:1999-12-31

PDF

110

被引次数

7

摘要： 借助于等温表面电位衰减、开路热刺激放电电流测量等方法较系统地研究了充电后的聚四氟乙烯(PTFE)多孔材料的空间电荷贮存稳定性,并和同等条件下的高密度PTFE薄膜驻极体的电荷稳定性进行了比较.通过热刺激放电电流谱(TSD)分析和组合热脉冲技术探索了PTFE驻极体多孔膜内电荷重心的迁移规律,研究了多孔PTFE薄膜驻极体内脱阱电荷的输运规律.

关键词: 多孔聚四氟乙烯, 驻极体, 电荷稳定性, 电荷输运

Abstract: The space charge storage stability of porous polytetrafluoroethylene (PT FE) films was studied and comparied with the solid PTFE film by means of the isothermal surface potential decay and the open circuit thermally stimulate discharge (TSD),etc. The shift rule of mean charge depth for the porous electret film was investigated and then the charge transportation characteristic of the film was studied by TSD experiment and thermal pulse technique.

Key words: porous PTFE, electret, charge transport, chargestability