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应用科学学报 ›› 2004, Vol. 22 ›› Issue (2): 167-172.

• 论文 • 上一篇    下一篇

基于测试操作划分的低峰值功耗扫描测试

李锐, 杨军, 吴光林, 凌明, 时龙兴   

  1. 东南大学国家专用集成电路系统工程技术研究中心 江苏南京 210096
  • 收稿日期:2003-03-27 修回日期:2003-06-04 出版日期:2004-06-30 发布日期:2004-06-30
  • 作者简介:李锐(1980-),男,江苏徐州人,博士生;时龙兴(1964-),男,江苏苏州人,教授,博导.
  • 基金资助:
    国家自然科学基金(60176018);江苏省高技术研究(BG2001015)资助项目

Low Peak Power Scan Testing Based on Partitioning Test Operation

LI Rui, YANG Jun, WU Guang-lin, LING Ming, SHI Long-xing   

  1. National ASIC System Engineering Research Center, Southeast University, Nanjing 210096, China
  • Received:2003-03-27 Revised:2003-06-04 Online:2004-06-30 Published:2004-06-30

PDF

90

被引次数

1

摘要： 提出了对同一时钟域中寄存器的测试操作进行划分的方法来降低测试峰值功耗,并且这种划分不需要重新生成测试向量,支持划分前生成测试向量的复用.实验表明,在稍微增加测试时间的条件下,所提出的测试方法能同时降低电路的峰值功耗、平均功耗和能耗.

关键词: 扫描, 峰值功耗, 测试, 可测性设计

Abstract: In this paper, we propose a new method to solve the peak power problem by partitioning the operation of flip-flops in the same clock domain during the scan test. This method need not regenerate test patterns so that the test patterns generated before partition can be reused. The experiments show that the proposed method can reduce the consumption of peak power, ave-rage power and energy simultaneously with a slight increase of test time.

Key words: design-for-test, test, scan, peak power

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