应用科学学报 ›› 1987, Vol. 5 ›› Issue (1): 66-71.

• 论文 • 上一篇    下一篇

溅射沉积InP薄膜的研究

黎锡强   

  1. 中国科学院上海冶金研究所
  • 收稿日期:1984-05-06 修回日期:1984-12-26 出版日期:1987-03-31 发布日期:1987-03-31

RF SPUTTERING OF InP FILMS

LI XIQIANG   

  1. Shanghai Institute of Metallurgy, Academia Sinica
  • Received:1984-05-06 Revised:1984-12-26 Online:1987-03-31 Published:1987-03-31

摘要: 本文报道了以射频溅射仪溅射沉积非晶态InP薄膜.并用X光衍射法、反射电子衍射怯、扫描电镜、红外分光光度计及俄歇能谱仪等研究了薄膜结构、貌相、组分及吸收边光谱等.并与富In的InP多晶薄膜作比较.

Abstract: The present paper is a report on the deposition of InP films on different substrates by sputtering. Using SEM, AES, X-ray diffractions, RED and infrared spectrophotometer, we have studied the topography, composition, crystal orientation, absorption edge spectrum etc.