Journal of Applied Sciences ›› 2000, Vol. 18 ›› Issue (1): 55-57.

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A Study on the Gd2O3-MgF2 Film by Positron Annihilation Life Spectroscopy

GUAN Yue-ying, SHI Zi-kang   

  1. Fujian Institute of Research on Structure of Matter, Academia Sinica, Fuzhou 350002, China
  • Received:1998-07-06 Revised:1999-03-24 Online:2000-03-31 Published:2000-03-31

Abstract: In this paper,the quality of Gd2O3-MgF2 film on thin quartz slice is determined by positron annihilation life spectroscopy. It illuminates the relationship between positron annihilation parameters and film structure.

Key words: positron annihilation, film, quality

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