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应用科学学报 ›› 2001, Vol. 19 ›› Issue (4): 369-370.

• 研究简报 • 上一篇    

TEM观察纳米金属粉末及纳米铜粉的异常表现

盛克平   

  1. 上海计量测试技术研究院, 上海 200233
  • 收稿日期:2000-12-09 修回日期:2001-02-28 出版日期:2001-12-31 发布日期:2001-12-31
  • 作者简介:盛克平(1950-),男,江苏无锡人,工程师.

TEM Observation of the Abnormal Behavior of Nanometer Metal Powder and Nanometer Copper Powder

SHENG Ke-ping   

  1. Shanghai Institute of Measurement & Testing Technology, Shanghai 200233, China
  • Received:2000-12-09 Revised:2001-02-28 Online:2001-12-31 Published:2001-12-31

PDF

96

被引次数

10

摘要： 用透射电子显微镜观察铜、铝、镍金属粉末,发现其中金属铜粉在粒度达到纳米级时,熔化温度大幅度降低,与铝粉等相比有很大差异.这一特性将有很大的潜在应用价值.

关键词: 透射电子显微镜, 纳米, 熔点, 表面张力

Abstract: Observing Cu, Al, Ni metal powder with an electron microscope, we discoveried that copper powder's melting point is much lower than the melting point of aluminum powder etc. When its size is reduced to nanometer scale. This characteristic will have great value in practical application.

Key words: nanometer, melting point, surface tension, transmission electron microscope

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