Journal of Applied Sciences ›› 1991, Vol. 9 ›› Issue (3): 280-282.

• Research Notes • Previous Articles    

A RIGOROUS METHOD OF MAGNETIC-LAYER THICKNESS MEASUREMENT

XUN PEIJUE1, LI GUIXIN2   

  1. 1. University of Electronic Science and Technology of China;
    2. Taiyuan Institute of Magnetic Recording Technology
  • Received:1990-04-07 Revised:1990-08-17 Online:1991-09-30 Published:1991-09-30

Abstract: In this paper, we propose a rigorous method of magnetic-layer thickness measurement by means of scanning electron microscopy (SEM). The sample manufacturing technique is introduced, and the SEM pictures of the magnetic-layer thickness of a flexible disk are given.

Key words: SEM, measurement method, flexible disk