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31 March 1985, Volume 3 Issue 1
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Articles
FINITE DEFORMATION ANALYSIS FOR STRESS CONCENTRATION AROUND A FREE NOTCH AND STRESS SINGULARITY AROUND A DEEP NOTCH
OUYANG CHANG, TANG GUOAN
1985, 3(1): 1-5.
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The expressions of stresses in finite deformation of an elliptic or parabolic notch in infinite elastic plane has been obtained by incremental analysis. Such expressions are functions of loads, notch shape and material behavior. The stress singularity for a deep notch has especially been discussed, and it is found that this singularity could be related with the stress intensity factor in linear fracture mechanics, but the order of this singularity has been changed from 1/√
ρ
to
α
ln 1/√
ρ
,
ρ
being the curvature radiu of the notch root,
α
a material constant. The new result here explains the difference between the cases of plane strain and plane stress.
GROUND-STATE ENERGY OF A STRONG-COUPLING EXCITON IN PIEZOELECTRIC CRYSTAL
GU SHIWEI, ZHOU YUKUI
1985, 3(1): 6-12.
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In this paper, some properties of a strong-coupling exciton in piezoelectric crystal are studied. An effective Hamiltanian of the exciton is obtained by the method of a linear-combination operator and a simple unitary transformation. The self-energy could be written as a series in
α
-1
, the first term being proportional to
α
, the coupling constant. The interaction potential induced by the interaction of the electron-hole with the phonons is related to coupling constant and sound speed etc.
AGING OF PIEZOELECTRIC CERAMIC PARAMETERS AND DETERIORATION OF TRANSDUCER PERFORMANCES
HUANG DANNI, WANG ZHICHAO, SHOD XINMIN, ZHENG ZHONGYOU, WANG HONG
1985, 3(1): 13-19.
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The variations of parameters of piezoelectric ceramics Fe1.5 and corresponding high power transmitting transducers with the logarithm of time have been examined separately with normal specimens and a certain type of vibrator under defined temperatures (room temperatures, 60℃ and 100℃), pressure (30 kg/cm
2
) and electrical power densities (0.3W/cm
3
·KC and 0.5W/cm
3
·KC) in this paper. Experimental results show that the causes of aging of
ε
33
T
and k
p
are not all the same. The varying tendency of the properties of ceramic elements after the cumulative action of the electrical power density of 0.3W/KC·cm
3
is different from that of the normal specimens under each single condition. Both the value of k
p
and
ε
33
T
are some what increased. It was considered that this aging behaviour was related to the internal bias electrical field of the ceramic material selves.
We would conclude that the aging of properties of piezoceramics under the given temperature, pressure and electrical power density is not serious enough to cause the deterioration of performances of transducer. The appropriate heat treatment will be favourable to stabilizing the performances of ceramic materials and transducers.
MICROSCOPIC QUANTUM THEORY OF THE OPTICAL WAVEGUIDE
SUN HONG, PENG QIANJUEN, FANG JUNXIN
1985, 3(1): 20-28.
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The present article takes the Frenkel exciton in a crystalline planar waveguide as a model to set up a microscopic quantum theory of the optical waveguide.
A NEW METHOD FOR MEASURING THE BIREFRINGENCE OF SINGLE-MODE FIBERS WITH SHORT BEAT-LENGTH OR NONUNIFORMITY
HUANG SHANGYUAN, LIN ZONGQJ
1985, 3(1): 29-37.
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A birefringence formula of single-mode optical fiber in terms of the positions of the highest peak and its adjacent valley on the curve of the measured polarization ellipticity via the fiber twist is proposed and the distortion of the measured curves for the fibers with nonuniform birefringence is discussed. The new measuring process which is based on null measurement is simple and reliable.
SOME CHARACTERISTICS OF Si-DOPED GaAs BULK CRYSTALS
MO PEIGEN
1985, 3(1): 38-45.
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In this paper, a study has been made of the compensation ratio (
θ
), the minority carrier diffusion length (
L
p
) and the dislocation density of Si-doped GaAs crystals grown by the horizontal Bridgman method. The study on compensation ratio shows that tie donor can be self-compensated through a defect equilibrium due to the formation of the Si
Ga
V
Ga
complex, when the carrier concentration is greater than 10
17
cm
-3
. Some relationships between
L
p
, dislocation density and
θ
have been found. The
L
p
decreases with the
θ
increasing and changes abruptly at around
θ
=0.3, while the
θ
found for dislocation-free and low dislocated crystals is greater than 0.38 with the carrier concentration in the range of 1~2×10
18
cm
-3
. It may be suggested that the
L
p
and dislocation density are related to Si
Ga
V
Ga
in some way, which is formed through the interaction between Si
Ga
and V
Ga
, and with V
Ga
created in turn from Si and O, by the removal of Si from Ga sites.
In general, the
θ
could be used as a satisfactory guide to the quality of Si-doped GaAs crystals.
THE PHOTOELECTROCHEMICAL PROPERTIES OF LIQUID JUNCTION SOLAR CELLS COMPOSED OF N-CdTe FILM ELECTRODES
DENG XUNNAN, PANG RENDE, GAN SHAOXIN
1985, 3(1): 46-51.
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The elementary photoelectrochemical properties of liquid junction solar cells composed of
N
-CdTe film electrotrodes are reported in this paper. The cell could be represented as
N
-CdTe/1
M
Na
2
S, 1
M
S. 1
M
NaOH/C
The electrode potential-current curves, voltage-current curves of the cells have been measured. The relationship between the irradiation intensity and the photovoltage, photocurrent and conversion efficiency have been determined. Under the irradiation of 60mW/cm
2
, the energy conversion efficiency is 1~2%. The band gap of the electrode is 1.43eV. The flatband potential of -1.1~-1.2V (VS·SCE)is determined by the measurement of the differential capacitance and the maximum open-circuit photopotential. Furthermore, the influence of the counter electrodes and electrolytes on the conversion efficiency have been tested.
DETERMINATION OF DEEP LEVER CENTERS ON GaAs MESFET BY CONDUCTANCE DLTS
SHENG CHI, ZHAN QIANBAO
1985, 3(1): 52-56.
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A conductance DLTS is developed to detect traps in epitaxial grown and ion-implanted GaAs MESFETS. The trap of
E
V
+0.91eV which is generally regarded as Cr level and the trap of
E
V
+0.52eV exist in both devices. Besides, a level of
E
V
4-0.71eV exists only in ion-implanted devices with large noise. A large and wide energy band at
E
V
+0.2~
E
V
+0.5eV is attributed to interface state which exists only in epitaxial large-noise FET and degraded devices.
The trap in ion-implanted GaAs FET can be decreased to a level of the best-quality epitaxial FET.
ANALYSIS OF WEIGHTED FILTERING
ZHANG RONGXIN
1985, 3(1): 57-64.
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In this paper, different fading memory filters have been discussed and a new technique to get weighted Sequences is given by using weight function sequence. This makes it possible to choose weight sequence according to majorization of some result functions.
AN IMPROVED PROGRAM USED FOR SEARCHING AND MATCHING OF X-RAY POWDER DIFFRACTION PATTERNS
LIN TEINHUI, ZHANG SAIZHU, CHEN LIJUN, CAIXINXING
1985, 3(1): 65-73.
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A program used for searching and matching of X-ray powder diffraction patterns was written and a library for this purpose was built by using FORTRAN-IV language. The program has been tested by using it to sdarch tens of patterns. Generally, all the existing phases can be searched out and the number of missearchings is not so large. In comparison with other programs, briefly, two major improvements have been made in the present program:(1) a so-called 'substance-type-discrimination' was introduced into the searching process which can reduce missearching remarkably; (2) a new method for quantitative intensity-matching was proposed, based on the least square method. It can give better results than the Frevel's method and provide more information to discriminate the canditates further.
SYNTHESIS OF POLYSULFONE-(OR POLYETHERSULFONE) EPOXY RESINBLOCK COPOLYMERS
DIKG YOUJUN, LEI YUQING, WANG XINRONG
1985, 3(1): 74-81.
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Polysulfone (or Polyethersulfone)-epoxy resin was synthesized by the interaction of dihydroxyl-terminated polysulfone (or polyethersnlfone) oligomers with epoxy resin.
The block copolymers have excellent adhesive properties with metals such as Al, Cu and Pe at high temperature (150℃).
FOCUSING METHOD FOR NONDESTRUCTIVE MEASUREMENT OF OPTICAL FIBER AND PREFORM INDEX PROFILE
XU KUODA, ZHANG ZHAONAN, HOU YUANGQINQ
1985, 3(1): 82-87.
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The focusing method is a nondestructive one for obtaining the refractive-index profile of fibers and preforms of different sizes. An uniform incoherent collimated light beam is passed transversely through the fiber or preform immersed in an index matching oil and the light intensity distribution is directly detected by a CdS photo conductive detector, or recorded on an X-Y recorder with the aid of silicon vidicon camera and sampling line oscilloscope. The refractive-index profile is finally computed by means of a microcomputer.
This paper relates briefly the principle of the method and experimental details and also gives the quantitative results and conclusions.
DISPERSION MEASUREMENT IN SINGLE-MODE FIBERS
HUANG ZHAOMING, YAO SHOUQUAN, ZHANG GUFAN
1985, 3(1): 88-91.
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We have measured dispersion of single-mode fibers by means of time domain and frequency domain methods at 0.82
μ
m. Since single-mode fibers designed for longer wavelengths have 2 or 3 modes at this wavelength, it is necessary to separate ntermodal dispersion from singlemode dispersion. The two methods gave the same iresult.
THE APPLICATION OF THE BOUNDARY ELEMENT METHOD TO SOLVING FREE BOUNDARY PROBLEMS
ZHENG JIADONG
1985, 3(1): 92-94.
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In this paper the free boundary problems are solved with boundary element method. The practical free surface of.seepage flow of an earth dam is calculated successfully.
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Bimonthly, Founded in 1983
Editor-in-Chief:Wang Tingyun
ISSN 0255-8297
CN 31-1404/N